Publications
Article
ИНСТРУМЕНТАЛЬНАЯ СРЕДА ДЛЯ ПРЕДСТАВЛЕНИЯ И ОБРАБОТКИ НЕЧЕТКИХ ЗНАНИЙ И ЕЕ ПРИЛОЖЕНИЯ
Article
Canonical Data Model for Data Warehouse
2016
72-79
Manual
ԽՆԴԻՐՆԵՐԻ ԼՈՒԾՈՒՄ PROLOG ԼԵԶՎՈՎ
2016
114
Article
Effective Algorithms to Support Grid Files
Conference
An efficient approach for memory repair by reducing the number of spares.
Conference
Extending fault periodicity table for testing faults in memories under 20nm.
Conference
A power based memory BIST grouping methodology.
Conference
Overview study on fault modeling and test methodology development for FinFET-based memories.
Conference
Securing Test Infrastructure of System-on-Chips
Conference
String Matching in Case of Periodicity in the Pattern
Conference
Armenia: Communicating to World Community in Electronic Test and Design
Conference
An Ontology Approach to Data Integration (Extended Abstract)..
Patent
Testing Electronic Memories Based on Fault and Test Algorithm Periodicity
Patent
FINFET-BASED MEMORY TESTING USING MULTIPLE READ OPERATIONS
Patent
DETECTION OF ADDRESS ERRORS IN MEMORY DEVICES USING MULTI-SEGMENT ERROR DETECTION CODES
Ematerial
Հաշվողական համակարգերի Նախագծման տեսություն
